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An Array-Based Test Circuit for Fully Automated Gate Dielectric Breakdown Characterization.
John Keane
Shrinivas Venkatraman
Paulo F. Butzen
Chris H. Kim
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2011)
Keyphrases
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fully automated
fully automatic
semi automated
labor intensive
manual segmentation
leakage current
low voltage
completely automated
high speed
medical images
cmos technology
short circuit
three dimensional
software testing
programmable logic
multiple input