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A Test Integration Methodology for 3D Integrated Circuits.
Che-Wei Chou
Jin-Fu Li
Ji-Jan Chen
Ding-Ming Kwai
Yung-Fa Chou
Cheng-Wen Wu
Published in:
Asian Test Symposium (2010)
Keyphrases
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integrated circuit
built in self test
data fusion
test data
electron beam
databases
integration testing
data sets
real world
machine learning
data integration
statistical tests
design methodology
hardware description language