Some Experiments in Test Pattern Generation for FPGA-Implemented Combinational Circuits.
Michel RenovellJean-Michel PortalPenelope FaureJoan FiguerasYervant ZorianPublished in: SBCCI (2000)
Keyphrases
- high speed
- logic circuits
- real time
- low cost
- signal processing
- asynchronous circuits
- data sets
- information retrieval
- image processing
- case study
- fpga device
- fpga hardware
- tunnel diode
- pipelined architecture
- quantum computing
- power reduction
- real time image processing
- data acquisition
- evolutionary algorithm
- computer vision