Test generation for fault isolation in analog circuits using behavioral models.
Sasikumar CherubalAbhijit ChatterjeePublished in: Asian Test Symposium (2000)
Keyphrases
- analog circuits
- test generation
- fault isolation
- behavioral models
- fault diagnosis
- fault detection
- test cases
- neural network
- hierarchical structures
- static analysis
- dynamic behaviors
- expert systems
- physical systems
- diagnostic tests
- fuzzy logic
- conceptual model
- software testing
- error detection
- databases
- data model
- abstract data types
- high level