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Extension of Inductive Fault Analysis to Parametric Faults in Analog Circuits with Application to Test Generation.
Zbigniew Jaworski
Mariusz Niewczas
Wieslaw Kuzmicz
Published in:
VTS (1997)
Keyphrases
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fault diagnosis
test generation
analog circuits
fault detection
test cases
static analysis
image processing
expert systems
genetic algorithm
decision trees
software engineering
low cost
test sequences
fault model
symbolic execution