Fabric Defect Detection Using Modified Local Binary Patterns.

Farshad Tajeripour Ehsanollah Kabir Abbas Sheikhi

Published in: EURASIP J. Adv. Signal Process. (2008)

Keyphrases

local binary pattern
texture classification
face recognition
multiscale
texture analysis
feature extraction
texture descriptors

texture information
spatial information
texture features
illumination invariant
rotation invariant
facial expression recognition
feature descriptors

background subtraction
face detection
scale and rotation invariant
geometric moments
binary patterns
gray level

pattern recognition
image processing
maximum likelihood
distance measure
image features
preprocessing