Fabric Defect Detection Using Modified Local Binary Patterns.
Farshad TajeripourEhsanollah KabirAbbas SheikhiPublished in: EURASIP J. Adv. Signal Process. (2008)
Keyphrases
- local binary pattern
- texture classification
- face recognition
- multiscale
- texture analysis
- feature extraction
- texture descriptors
- texture information
- spatial information
- texture features
- illumination invariant
- rotation invariant
- facial expression recognition
- feature descriptors
- background subtraction
- face detection
- scale and rotation invariant
- geometric moments
- binary patterns
- gray level
- pattern recognition
- image processing
- maximum likelihood
- distance measure
- image features
- preprocessing