Statistical modelling of analog circuits for test metrics computation.

Kamel Beznia Ahcène Bounceur Salvador Mir Reinhardt Euler

Published in: DTIS (2013)

Keyphrases

analog circuits
fault diagnosis
statistical significance
digital circuits
statistical tests
wavelet packet transform
statistical data
test cases
real time
statistical models
post hoc
evaluation metrics
data driven
knowledge management
low cost
relational databases
machine learning