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Accelerating Electromigration Aging: Fast Failure Detection for Nanometer ICs.
Sheriff Sadiqbatcha
Zeyu Sun
Sheldon X.-D. Tan
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2020)
Keyphrases
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failure detection
failure diagnosis
fault detection
age estimation
electron microscopy
age related
software aging
wet lab
multiscale
fault diagnosis
highly reliable
real time
genetic algorithm
application server
image sequences
case study
neural network