Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach.
Rabeb KherijiV. DanelonJean-Louis CarbonéroSalvador MirPublished in: DATE (2005)
Keyphrases
- test set
- training set
- high noise
- error rate
- low signal to noise ratio
- training data
- high sensitivity
- random noise
- test data
- evaluation methodology
- test cases
- noisy data
- signal to noise ratio
- noise level
- missing data
- image noise
- noise free
- defect detection
- additive noise
- image processing
- signal noise ratio
- gaussian noise