-Fault Model for Deep-Submicron LSI Circuits.

Yuta Yamato Yusuke Nakamura Kohei Miyase Xiaoqing Wen Seiji Kajihara

Published in: IEICE Trans. Inf. Syst. (2008)

Keyphrases

fault model
vlsi circuits
fault models
latent semantic indexing
safety analysis
fault injection
text retrieval
model based diagnosis
electron beam
vector space
low power
fault management
high speed
circuit design
mixed signal
delay insensitive