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Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection.
J. Th. van der Linden
M. H. Konijnenburg
Ad J. van de Goor
Published in:
Asian Test Symposium (1998)
Keyphrases
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test generation
complete search
conflict detection
high speed
test cases
symbolic execution
design automation
test sequences
static analysis
search space
data sets
quality assurance
dynamic programming
data model
access control
relational databases
high level