J. Th. van der Linden

Publication Activity (10 Years)

Years Active: 1993-2002
Publications (10 Years): 0

Publications

M. J. Geuzebroek, J. Th. van der Linden, Ad J. van de Goor
Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume. ITC (2002)
M. J. Geuzebroek, J. Th. van der Linden, Ad J. van de Goor
Test point insertion for compact test sets. ITC (2000)
M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
Illegal State Space Identification for Sequential Circuit Test Generation. DATE (1999)
M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
Testability of the Philips 80C51 micro-controller. ITC (1999)
J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor
Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection. Asian Test Symposium (1998)
M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
Sequential Test Generation with Advanced Illegal State Search. ITC (1997)
J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor
Circuit Partitioned Automatic Test Pattern Generation Constrained by Three-State Buses and Restrictors. Asian Test Symposium (1996)
M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
Accelerated Compact Test Set Generation for Three-State Circuits. ITC (1996)
M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
Compact test sets for industrial circuits. VTS (1995)
J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor
Test generation and three-state elements, buses, and bidirectionals. VTS (1994)
J. Th. van der Linden, M. H. Konijnenburg, Ad J. van de Goor
Parallel Pattern Fast Fault Simulation for Three-State Circuits and Bidirectional I/O. ITC (1994)
M. H. Konijnenburg, J. Th. van der Linden, Ad J. van de Goor
Test Pattern Generation with Restrictors. ITC (1993)