Parallel Pattern Fast Fault Simulation for Three-State Circuits and Bidirectional I/O.

J. Th. van der Linden M. H. Konijnenburg Ad J. van de Goor

Published in: ITC (1994)

Keyphrases

input output
parallel processing
simulation model
parallel computers
neural network
high speed
fault diagnosis
fault detection
parallel computing
massively parallel
simulation environment
simulation models
asynchronous cellular automata