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Circuit Partitioned Automatic Test Pattern Generation Constrained by Three-State Buses and Restrictors.
J. Th. van der Linden
M. H. Konijnenburg
Ad J. van de Goor
Published in:
Asian Test Symposium (1996)
Keyphrases
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information systems
semi automatic
state space
database
databases
neural network
mobile robot
probabilistic model
high speed
data driven
fully automatic
public transport
analog circuits