Temperature-independence-point properties for 0.1μm-scale pocket-implant technologies and the impact on circuit design.
Kazuya HisamitsuHiroaki UenoMasayasu TanakaDaisuke KitamaruMitiko Miura-MattauschHans Jürgen MattauschShigetaka KumashiroTetsuya YamaguchiKyoji YamashitaNoriaki NakayamaPublished in: ASP-DAC (2003)