A Fault Simulation Based Test Pattern Generator for Synchronous Sequential Circuits.

Ruifeng Guo Irith Pomeranz Sudhakar M. Reddy

Published in: VTS (1999)

Keyphrases

pattern generator
high speed
circuit design
fault diagnosis
statistical tests
quantum computing
genetic algorithm
image sequences
optical flow
test cases
test data
parallel algorithm
fault detection
delay insensitive