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30-Gb/s optical and electrical test solution for high-volume testing.
Daisuke Watanabe
Shin Masuda
Hideo Hara
Tsuyoshi Ataka
Atsushi Seki
Atsushi Ono
Toshiyuki Okayasu
Published in:
ITC (2013)
Keyphrases
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high volume
test cases
software testing
real time
test data
big data
statistical tests
test generation
database
case study
database systems
test suite
printed circuit boards
machine learning
decision making
high speed