Toshiyuki Okayasu

Publication Activity (10 Years)

Years Active: 1994-2013
Publications (10 Years): 0

Top Topics

Printed Circuit Boards

Multiresolution

Wavelet Analysis

Top Venues

Publications

Daisuke Watanabe, Shin Masuda, Hideo Hara, Tsuyoshi Ataka, Atsushi Seki, Atsushi Ono, Toshiyuki Okayasu
30-Gb/s optical and electrical test solution for high-volume testing. ITC (2013)
Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu
Real-time testing method for 16 Gbps 4-PAM signal interface. ITC (2012)
Masahiro Ishida, Kiyotaka Ichiyama, Daisuke Watanabe, Masayuki Kawabata, Toshiyuki Okayasu
Real-time testing method for 16 Gbps 4-PAM signal interface. ITC (2011)
Tasuku Fujibe, Masakatsu Suda, Kazuhiro Yamamoto, Yoshihito Nagata, Kazuhiro Fujita, Daisuke Watanabe, Toshiyuki Okayasu
Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing. ITC (2009)
Daisuke Watanabe, Atsushi Ono, Toshiyuki Okayasu
CMOS optical 4-PAM VCSEL driver with modal-dispersion equalizer for 10Gb/s 500m MMF transmission. ISSCC (2009)
Kazuhiro Yamamoto, Masakatsu Suda, Toshiyuki Okayasu
2GS/s, 10ps Resolution CMOS Differential Time-to-Digital Converter for Real-Time Testing of Source-Synchronous Memory Device. CICC (2007)
Toshiyuki Okayasu, Masakatsu Suda, Kazuhiro Yamamoto, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe
4GHz ATE Applications. ISSCC (2006)
Kazuhiro Yamamoto, Masakatsu Suda, Toshiyuki Okayasu, Hirokatsu Niijima, Koichi Tanaka
Multi Strobe Circuit for 2.133GHz Memory Test System. ITC (2006)
Masakatsu Suda, Kazuhiro Yamamoto, Toshiyuki Okayasu, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe
CMOS high-speed, high-precision timing generator for 4.266-Gbps memory test system. ITC (2005)
Daisuke Watanabe, Masakatsu Suda, Toshiyuki Okayasu
34.1Gbps Low Jitter, Low BER High-Speed Parallel CMOS Interface for Interconnections in High-Speed Memory Test System. ITC (2004)
Toshiyuki Okayasu, Masakatsu Suda, Kazuhiro Yamamoto
CMOS Circuit Technology for Precise GHz Timing Generator. ITC (2002)
Takashi Sekino, Toshiyuki Okayasu
Ultra Hi-Speed Pin-Electronics and Test Station Using GaAs IC. ITC (1994)