Multi Strobe Circuit for 2.133GHz Memory Test System.

Kazuhiro Yamamoto Masakatsu Suda Toshiyuki Okayasu Hirokatsu Niijima Koichi Tanaka

Published in: ITC (2006)

Keyphrases

high speed
test data
memory requirements
memory usage
analog circuits
test cases
computing power
database
real time
database systems
statistical significance
memory space
limited memory
memory access