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Ultra Hi-Speed Pin-Electronics and Test Station Using GaAs IC.

Takashi SekinoToshiyuki Okayasu
Published in: ITC (1994)
Keyphrases
  • high speed
  • integrated circuit
  • real time
  • data sets
  • databases
  • real world
  • information systems
  • decision making
  • artificial neural networks
  • statistical tests
  • processing speed
  • electronic circuits
  • gallium arsenide