A 409 GOPS/W Adaptive and Resilient Domino Register File in 22 nm Tri-Gate CMOS Featuring In-Situ Timing Margin and Error Detection for Tolerance to Within-Die Variation, Voltage Droop, Temperature and Aging.
Jaydeep P. KulkarniCarlos TokunagaPaolo A. AseronTrang NguyenCharles AugustineJames W. TschanzVivek DePublished in: IEEE J. Solid State Circuits (2016)
Keyphrases
- error detection
- cmos technology
- low voltage
- error correction
- leakage current
- nm technology
- power supply
- low power
- error recovery
- metal oxide semiconductor
- power consumption
- low cost
- error correcting
- data cleansing
- room temperature
- fault tolerance
- electric field
- high speed
- parallel processing
- power dissipation
- electrical power
- error resilient
- bit rate
- error control
- fault isolation
- wind speed
- image sensor
- metal oxide