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A Probabilistic Model for Path Delay Fault Testing.
Chih-Yuang Su
Cheng-Wen Wu
Published in:
J. Inf. Sci. Eng. (2000)
Keyphrases
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probabilistic model
fault model
fault diagnosis
fault detection
language model
bayesian networks
test cases
test data
real time embedded systems
destination node
path length
test set
artificial intelligence
neural network
critical path
path selection
loss probability
sufficient conditions
multiple faults