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On Finding Don't Cares in Test Sequences for Sequential Circuits.
Yoshinobu Higami
Seiji Kajihara
Irith Pomeranz
Shin-ya Kobayashi
Yuzo Takamatsu
Published in:
IEICE Trans. Inf. Syst. (2006)
Keyphrases
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test sequences
bit rate
video sequences
test cases
database
real time
computer vision
test generation
mutation testing
data sets
machine learning
open source
logic circuits