Radiation-enhanced channel length modulation induced by trapped charges in buried oxide layer.
Xin XieHuilong ZhuMengying ZhangDawei BiZhiyuan HuZhengxuan ZhangShichang ZouPublished in: IEICE Electron. Express (2019)
Keyphrases
- silicon dioxide
- x ray
- infrared
- ofdm system
- ultra wideband
- middle layer
- multi channel
- modulation scheme
- amplitude modulation
- single channel
- field effect transistors
- received signal
- metal oxide
- multi layer
- frequency selective
- orthogonal frequency division multiplexing
- channel estimation
- power allocation
- application layer
- low density parity check
- packet size
- mimo systems
- high temperature
- electron microscopy
- fuel cell
- signal to noise ratio
- three dimensional