Evaluation of Electron Scattering in High-Resolution X-Ray Mask Fabrication.
G. MessinaA. PaolettiS. SantangeloA. TucciaronePublished in: EUROSIM (1992)
Keyphrases
- x ray
- electron beam
- electron microscope
- transmission electron microscopy
- electron microscopy
- high resolution
- electron beam lithography
- metal oxide
- x ray images
- three dimensional
- digital x ray images
- medical imaging
- ct scans
- low resolution
- integrated circuit
- image processing
- intraoperative
- projection images
- high quality
- computer tomography
- micro ct
- fluoroscopic images
- tomographic images
- high density
- high speed
- noise level
- noisy images
- dual energy
- pre operative
- digital subtraction angiography