A TDC-based nano-scale displacement measure method inside scanning electron microscopes.
Chao ZhouYu WangLu DengZhengxing WuZhiqiang CaoShuo WangMin TanPublished in: ROBIO (2016)
Keyphrases
- experimental evaluation
- support vector machine
- similarity measure
- detection method
- significant improvement
- mutual information
- high accuracy
- nano scale
- clustering method
- preprocessing
- three dimensional
- cost function
- computational complexity
- segmentation method
- high precision
- image restoration
- optimization method
- face recognition