A methodology for defect detection in analog circuits based on causal feature selection.
Gildas LégerAntonio J. GinésValentin GutierrezManuel J. BarraganPublished in: ICECS 2022 (2022)
Keyphrases
- defect detection
- analog circuits
- feature selection
- feature extraction
- digital circuits
- fault diagnosis
- mutual information
- neural network
- bayesian networks
- text categorization
- markov blanket
- automated visual inspection
- feature subset
- feature space
- feature set
- causal models
- selected features
- causal reasoning
- pattern recognition
- image processing