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Lock-in thermal laser stimulation for non-destructive failure localization in 3-D devices.
Kristof J. P. Jacobs
T. Wang
Michele Stucchi
Mario Gonzalez
Kris Croes
Ingrid De Wolf
Eric Beyne
Published in:
Microelectron. Reliab. (2017)
Keyphrases
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injection lasers
indoor localization
mobile devices
infrared
concurrency control
failure prediction
laser beam
localization algorithm
thermal images
solder ball connect
thermal imaging
localization error
failure detection
root cause
object localization
smart phones
control system