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Test generation for sequential circuits using individual initial value propagation.

Takuji OgiharaShuichi SaruyamaShinichi Murai
Published in: ICCAD (1988)
Keyphrases
  • test generation
  • test cases
  • test sequences
  • design automation
  • symbolic execution
  • quality assurance
  • software testing
  • static analysis
  • computer vision
  • high quality
  • circuit design
  • mutation testing