Generating Compact Test Patterns for DC and AC Faults Using One ATPG Run.

Yi-Cheng Kung Kuen-Jong Lee Sudhakar M. Reddy

Published in: ITC (2018)

Keyphrases

test cases
built in self test
similar patterns
root cause
fault detection
fault diagnosis
knowledge base
integrated circuit
databases
frequent patterns
software testing
model based diagnosis
statistical tests
expert systems
lower bound
video sequences
case study
website
data mining
neural network