Defect Classification of Electronic Board Using Dense SIFT and CNN.
Yuji IwahoriYohei TakadaTokiko ShiinaYoshinori AdachiManas Kamal BhuyanBoonserm KijsirikulPublished in: KES (2018)
Keyphrases
- defect classification
- cellular neural networks
- object recognition
- keypoints
- stereo correspondence
- scale invariant
- convolutional neural network
- computer vision
- scale invariant feature transform
- hidden markov models
- image retrieval
- neural network
- feature descriptors
- face detection
- d objects
- shape context
- design automation
- clustering algorithm