Sub-µ structured Lotus Surfaces Manufacturing
Matthias WorgullMathias HeckeleTimo MappesMatthis BadeGuido ToselloTobias MetzJerome GavilletPeter KoltayHans Nørgaard HansenPublished in: CoRR (2008)
Keyphrases
- three dimensional
- free form
- quality control
- production planning
- manufacturing systems
- manufacturing environment
- surface reconstruction
- surface features
- geometric features
- simply connected
- semiconductor manufacturing
- manufacturing processes
- surface roughness
- production process
- smooth surfaces
- multiscale
- decision making
- range data
- structured data