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A Physically Unclonable Function with 0% BER Using Soft Oxide Breakdown in 40nm CMOS.
Kai-Hsin Chuang
Erik Bury
Robin Degraeve
Ben Kaczer
Dimitri Linten
Ingrid Verbauwhede
Published in:
A-SSCC (2018)
Keyphrases
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leakage current
low voltage
error rate
metal oxide
high speed
low cost
cmos technology
low power
transmission electron microscopy
neural network
circuit design