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A Physically Unclonable Function with 0% BER Using Soft Oxide Breakdown in 40nm CMOS.

Kai-Hsin ChuangErik BuryRobin DegraeveBen KaczerDimitri LintenIngrid Verbauwhede
Published in: A-SSCC (2018)
Keyphrases
  • leakage current
  • low voltage
  • error rate
  • metal oxide
  • high speed
  • low cost
  • cmos technology
  • low power
  • transmission electron microscopy
  • neural network
  • circuit design