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Scan Flip-Flop Grouping to Compress Test Data and Compact Test Responses for Launch-on-Capture Delay Testing.
Dong Xiang
Zhen Chen
Laung-Terng Wang
Published in:
ACM Trans. Design Autom. Electr. Syst. (2012)
Keyphrases
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test data
test cases
test set
training data
testing process
search based testing
software testing
power dissipation
training set
data sets
test generation
error rate
active learning
training and test data
regression testing
training samples
decision trees
test suite
real time
test data generation
database