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Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability.

Steve StoffelsNiels PosthumaStefaan DecoutereBenoit BakerootAndrea Natale TallaricoEnrico SangiorgiClaudio FiegnaJ. ZhengX. MaMatteo BorgaElena FabrisMatteo MeneghiniEnrico ZanoniGaudenzio MeneghessoJuraj PriesolAlexander Satka
Published in: IRPS (2019)
Keyphrases
  • data driven
  • nano scale
  • decision making
  • database
  • three dimensional
  • video sequences
  • image analysis
  • cmos technology
  • image processing
  • edge detection
  • field effect transistors