Stuck-Open Fault Leakage and Testing in Nanometer Technologies.

Julio César Vázquez Víctor H. Champac Chuck Hawkins Jaume Segura

Published in: VTS (2009)

Keyphrases

fault model
fault diagnosis
open systems
emerging technologies
data mining
test set
test cases
fault detection
fault injection
databases
multimedia
case study
expert systems
information technology