Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects.

Mahmut Yilmaz Krishnendu Chakrabarty Mohammad Tehranipoor

Published in: ITC (2008)

Keyphrases

pattern matching
data sets
selection strategy
small number
pattern discovery
selection algorithm
statistical tests
case study
feature extraction
high speed
test data
layout design
random selection
pattern detection
decision trees
search engine
information retrieval
machine learning
data mining