Pseudo-exhaustive testing of sequential circuits for multiple stuck-at faults.

Anzhela Yu. Matrosova Eugeniy Mitrofanov

Published in: EWDTS (2016)

Keyphrases

high speed
test cases
fault diagnosis
neural network
low cost
database
databases
artificial neural networks
combining multiple
testing process
asynchronous circuits
fault model
delay insensitive
built in self test