Low-temperature admittance spectroscopy for defect characterization in Cu(In,Ga)(S,Se)2 thin-film solar cells.
Jonathan ParionRomain ScaffidiDenis FlandreGuy BrammertzBart VermangPublished in: EUROCON (2023)
Keyphrases
- electron microscopy
- thin film
- genetic algorithm ga
- genetic algorithm
- high density
- short circuit
- fitness function
- multi layer
- multi objective
- grain size
- solar cell
- room temperature
- x ray
- simulated annealing
- defect detection
- evolutionary algorithm
- white light interferometry
- plasma etching
- film thickness
- cost effective
- fuzzy logic
- artificial neural networks