On Fault Testing for Reversible Circuits.

Satoshi Tayu Shigeru Ito Shuichi Ueno

Published in: IEICE Trans. Inf. Syst. (2008)

Keyphrases

fault model
fault diagnosis
cellular automata
markov chain
fault detection
high speed
fault models
test cases
analog circuits
fault injection
real time embedded systems
delay insensitive
statistical tests
software testing