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Layout-aware variation evaluation of analog circuits and its validity on op-amp designs.
Kota Shinohara
Mihoko Hidaka
Jing Li
Qing Dong
Bo Yang
Shigetoshi Nakatake
Published in:
ACM Great Lakes Symposium on VLSI (2011)
Keyphrases
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analog circuits
fault diagnosis
expert systems
evaluation method
data sets
high speed
evaluation criteria
relational databases
data model
query language
np complete
digital circuits
wavelet packet transform
clustering validity