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Wear-out, breakdown occurrence and failure detection in 18-25 Å ultrathin oxides.

Frederic MonsieurE. VincentG. PananakakisGérard Ghibaudo
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • room temperature
  • failure detection
  • failure diagnosis
  • fault detection
  • multiscale
  • highly reliable
  • real time
  • feature selection
  • occurrence frequency