Test generation in VLSI circuits for crosstalk noise.

Weiyu Chen Sandeep K. Gupta Melvin A. Breuer

Published in: ITC (1998)

Keyphrases

vlsi circuits
test generation
test cases
test sequences
symbolic execution
static analysis
design automation
low power
quality assurance
software testing
mixed signal
real time
relational databases
signal to noise ratio
power consumption
low cost
databases