Login / Signup

Test Vector Generation for Parametric Path Delay Faults.

Mukund SivaramanAndrzej J. Strojwas
Published in: ITC (1995)
Keyphrases
  • test cases
  • built in self test
  • fault diagnosis
  • feature vectors
  • shortest path
  • test data
  • fault detection
  • generation process
  • information systems
  • vector space
  • endpoints
  • test sequences