Login / Signup

Test pattern generation for crosstalk faults considering the gate delay.

Noriyoshi ItazakiKozo KinoshitaHisao Naitoh
Published in: Systems and Computers in Japan (1995)
Keyphrases
  • fault diagnosis
  • fault detection
  • fault detection and diagnosis
  • fault model
  • multiple faults
  • nano scale
  • correlation analysis
  • processor sharing
  • neural network
  • genetic algorithm
  • video sequences
  • model based diagnosis