A static test compaction technique for combinational circuits based on independent fault clustering.
Yahya E. OsaisAiman H. El-MalehPublished in: ICECS (2003)
Keyphrases
- clustering algorithm
- logic circuits
- k means
- fault diagnosis
- high speed
- clustering method
- hierarchical clustering
- real time
- self organizing maps
- data clustering
- built in self test
- delay insensitive
- document clustering
- information theoretic
- statistical tests
- categorical data
- fault detection
- statistical significance
- graph theoretic
- image segmentation
- diagnostic tests
- decision trees
- quantum computing
- data sets