Login / Signup
Mutation testing cost reduction by clustering overlapped mutants.
Yu-Seung Ma
Sang-Woon Kim
Published in:
J. Syst. Softw. (2016)
Keyphrases
</>
mutation testing
cost reduction
test sequences
test generation
test suite
database applications
test cases
finite state machines
integration testing
cost savings
testing process
video sequences
databases
training data
black box
lead time