Testing High Speed VLSI Devices Using Slower Testers.
Angela KrsticKwang-Ting (Tim) ChengSrimat T. ChakradharPublished in: VTS (1999)
Keyphrases
- high speed
- test cases
- software testing
- low power
- test data
- mobile devices
- real time
- high speed networks
- frame rate
- vlsi circuits
- testing process
- signal processing
- neural network
- ambient intelligence
- embedded systems
- low cost
- statistical tests
- intelligent environments
- pattern recognition
- test generation
- embedded devices
- video sequences
- data structure