gate dielectric.

Xiao Zou Guojia Fang Longyan Yuan Xingsheng Tong Xingzhong Zhao

Published in: Microelectron. Reliab. (2010)

Keyphrases

silicon dioxide
gate dielectrics
leakage current
nano scale
field effect transistors
multiple input
low voltage
database
high density
high temperature
knowledge base
transmission line
liquid crystal displays
electrical properties