Reduction of SOC test data volume, scan power and testing time using alternating run-length codes.
Anshuman ChandraKrishnendu ChakrabartyPublished in: DAC (2002)
Keyphrases
- test data
- run length
- test cases
- test set
- gray level
- search based testing
- training data
- testing process
- data sets
- texture information
- training and test data
- data hiding
- sample size
- training set
- software testing
- error correction
- test data generation
- image processing
- decision trees
- image segmentation
- compression rate
- multiresolution
- high dimensional
- multiscale
- database